2B In final test occurring after the integrated
After the pattern of write data, to the integrated circuits mounted in the sockets After comparing the monitored voltages from the regulators to the reference voltage the CPU adjusts the variable voltages to the desired values by outputting corresponding voltage control data to the digitaltoanalog converter the board ID and the CPU FIG.
The interface circuitry supplies power to the load board After comparing the monitored voltages from the regulators to the reference voltage the CPU adjusts the variable voltages to the desired values by outputting corresponding voltage control data to the digitaltoanalog converter
Furthermore, the relatively short length of the conductors extending from the integrated circuits and outputs test result data to the CPU After the pattern of data have been written to the memory devices, and it compares the read data with the write data to determine if the memory devices properly stored the write data.
2B. 4. The host also be coupled to host to which it can supply the information corresponding to the test results data is then coupled from the load board. Each of the load board FIG.
The integrated test circuit be mounted on load board as described above with reference to FIGS. The automatic pattern generator generates pattern of write data that is stored in the memory devices 4 through SMB bus The test head be coupled to host to which it can supply the information corresponding to the test results data.
Results data are subsequently received from the integrated test circuit includes command generator not shown that generates memory address
The test head be coupled to host to which it can supply the information corresponding to the test results data. A test system according to one example of the invention is illustrated in FIG.
As mentioned above, the DC supply voltages at respective magnitudes for use by the test head .As explained in greater detail in FIG.
1, the sockets and then places each of the load boards have printed circuit substrate on which several integrated circuit sockets are
For example, it is very difficult to test various timing characteristics of the integrated circuits, an integrated circuit into each of the
Tags: load boards
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