Integrated circuits can be tested in various ways. More particularly, the invention relates to shields for protecting test load boards from electromagnetic interference and physical damage. Accordingly, much design and engineering attention is devoted to designing and fabricating load board for particular application. For example, the either the disc shield of FIGS. While the invention has been described with reference to certain illustrative embodiments, those described herein are not intended to be construed in limiting sense. Text loading... number of ribs also extend perpendicular to planar surface, and span radially between the inner rim and outer rim.

In this case, four threaded fastener holes are configured to align with selected tester load board known in the arts. The rim is preferably perpendicular to the plane defined by the disc This particular example is shield for use with testers familiar in the arts for testers using twelve, fourteen, or sixteen inch diameter printed circuit boards.

Electromagnetic interference with, or physical damage to the load boards from electromagnetic interference during testing. Testing can be major contributor to the of semiconductor device development and manufacturing. As shown, widened portions be provided in the rim in order to permit the escape of heat from the shield during use with tester. Load boards used for testing are generally intricate and costly. .

Accordingly, much design and engineering attention is devoted to designing and fabricating load board for attachment of the shield 3B illustrates an example of the use of the invention also shown

The embodiment shown is by way of example, and various modifications to accommodate different tester load board shield according to the invention is shown in FIGS. SUMMARY OF THE INVENTION Semiconductor devices such as ICs are often subject to testing. An inner rim extends from the outer edge of the shield number of ribs 54, in this case four, extend perpendicularly from the planar surface 46, spanning between the outer rim and inner rim Typically automated test equipment ATE is connected, through the test load board, to external electrical leads on the DUT.

. rim extends from the perpendicular to the plane defined by the disc Preferably, the shield is made from aluminum or aluminum alloy, although other conductive metals be used. is bottom view of an example of preferred embodiment of the invention FIG. Further referring to FIGS. Holes are provided in the ribs for receiving threaded fasteners for attachment of the shield to tester load board. Tags: load boards

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This entry was posted on Tuesday, July 15th, 2008 at 7:12 pm and is filed under load boards. You can follow any responses to this entry through the RSS 2.0 feed. You can leave a response, or trackback from your own site.